The content of the ARM website is available to any browser, but for the best experience we highly recommend you upgrade to a standards-compliant browser such as Firefox, Opera or Safari.
VIEW CART
primary link menu HOME SITE INDEX PEOPLE
skip to main content ABOUT ARMABOUT ACRFSCIENCESITESINSTRUMENTSMEASUREMENTSDATAPUBLICATIONSEDUCATIONFORMS
Cover image

A Semianalytic Technique to Speed Up Successive Order of Scattering Model for Optically Thick Media

Duan, M. and Min, Q., Atmospheric Sciences Research Center, State University of New York
Fourteenth Atmospheric Radiation Measurement (ARM) Science Team Meeting

A semianalytic technique has been developed to speed up integration of radiative transfer over optically thick media for the successive order of scattering method. Based on characteristics of internal distribution of scattering intensity, this technique uses piece-wise analytic eigenfunctions to fit internal scattering intensities and integrates them analytically over optical depth. This semianalytic approach greatly reduces the number of sub-grids for accurately solving radiative transfer based on the successive order of scattering method. Results show that the accuracy of 1% for both Flux and radiance (polar angle less than 67 degree) can be archived with an averaged sub-grid optical depth of 1. This technique is accurate and efficient and makes the successive order of scattering method applicable for optically thick scattering media.

Note: This is the poster abstract presented at the meeting; an extended version was not provided by the author(s).